The experimental conditions used for the physicochemical characterization of all LSPE/xSBA-15 and LDPE/xTEO@SBA-15 films are described in detail in previous recent publications [21 (link),23 (link),24 (link)]. Briefly, a Bruker XRD D8 Advance diffractometer, Bruker GmbH, Mannheim, Germany was employed to carry out XRD analysis to all films i.e., LDPE/xSBA-15, LDPE/xTEO@SBA-15, and the pure LDPE films, to define the crystal structures of the resulted materials. The interactions between the incorporated SBA-15 and TEO@SBA-15 nanostructures with the LDPE polymeric matrix were studied using an FT/IR-6000 JASCO Fourier-transform spectrometer, JASCO company, Easton, MD, USA.
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