A Malvern Zetasizer NanoSeries was used to measure the size distribution and ζ-potential of the samples. In addition, SEM (JEOL JSM-7800F, Pleasanton, CA, USA) was used to evaluate the morphology of the nanoparticles. Samples were diluted 1 to 10 before deposition on an aluminum film. FTIR spectra were collected on a Spectrum spectrometer (Perkin Elmer Inc., Waltham, MA, USA) equipped with a single attenuated total reflectance (ATR) diamond set to a range of 400 cm−1 to 4000 cm−1 [31 (link)].
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