Samples of selenite-amended culture were treated and analyzed as previously described (25 (link)). The samples were examined in an FEI Tecnai F20 field emission gun (FEG) transmission electron microscope operating at 200 kV and fitted with a Gatan Orius SC600A charge-coupled-device (CCD) camera, an Oxford Instruments XMax SDD energy-dispersive X-ray (EDX) detector, and a high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) detector.
For thin-section analysis, after the ethanol dehydration steps, the cells were embedded in EMbed 812 epoxy resin and cut into thin sections (90 nm, using a diamond knife on a Reichert Ultracut S ultramicrotome). The sections were supported on copper grids and coated with carbon. TEM specimen holders were cleaned by plasma prior to TEM analysis to minimize contamination. Samples were examined with a high-resolution Philips CM 200 transmission electron microscope at an acceleration voltage of 200 kV under standard operating conditions with the liquid nitrogen anticontaminator in place.
For thin-section analysis, after the ethanol dehydration steps, the cells were embedded in EMbed 812 epoxy resin and cut into thin sections (90 nm, using a diamond knife on a Reichert Ultracut S ultramicrotome). The sections were supported on copper grids and coated with carbon. TEM specimen holders were cleaned by plasma prior to TEM analysis to minimize contamination. Samples were examined with a high-resolution Philips CM 200 transmission electron microscope at an acceleration voltage of 200 kV under standard operating conditions with the liquid nitrogen anticontaminator in place.
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