A Zeiss Sigma FEG VP SEM with EDS and an FEI Tecnai F20 HRTEM equipped with STEM and EDS capabilities operated at an accelerating voltage of 200 kV were used for the imaging and chemical analysis of the samples. EELS data acquisition was carried out using a JEOL F200 STEM microscope equipped with a Gatan GIF Quantum IS that features a direct detection K2 camera which is capable of acquiring EELS data in electron counting mode, as well as low-dose energy filtered and TEM images at a frame rate up to 1,600 images in in situ mode (Hart et al., 2017 (link)). For SEM analysis, samples were loaded onto a standard aluminum stub with a double-sided carbon and single-sided copper tape. For TEM analysis, samples were drop-cast onto 300 mesh copper grids with lacey carbon coatings (Ted Pella Inc., # 01895, Redding, California).
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Multi-Modal Microscopy Analysis Methodology
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Corresponding Organization : Portland State University
Other organizations : Oregon Health & Science University
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Variable analysis
independent variables
- Accelerating voltage of 200 kV
- Use of Zeiss Sigma FEG VP SEM, FEI Tecnai F20 HRTEM, and JEOL F200 STEM microscopes
- Imaging of samples
- Chemical analysis of samples
- EELS data acquisition
- Sample preparation: Samples loaded onto aluminum stubs with carbon and copper tape (for SEM) and drop-cast onto copper grids with lacey carbon coatings (for TEM)
- No positive or negative controls explicitly mentioned
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