The Atomic Force Microscopy (AFM) images were obtained using a Bruker Dimension Icon microscope. A thin slice of the sample was mounted onto a metallic disc glued with double-sided tape, and, for the electrical measurements, a thin layer of silver paint was used to connect the sample surface to the metallic disc and the microscope stage. Given the fact that Young’s moduli of PEDOT:PSS and PLGA are of the order of a few GPa [43 (link),44 (link)], for the nanomechanical measurements performed using the Quantitative Nanomechanics kit from Bruker, a Bruker RTESPA probe (nominal spring constant, k = 40 N/m, tip radius 8 nm) was selected since it is the one recommended for Young’s modulus ranging from 0.2 to 8.1 GPa. On the other hand, to obtain the surface potential maps by means of Kelvin Probe Force Microscopy (KPFM), a Bruker PFQNE-AL probe was used (k = 0.8 N/m, tip radius 5 nm). In this case, the work function of the tip was measured by using a gold/aluminum calibration sample (Bruker PFKPFM-SMPL) since the work function of gold can be averaged to 5.38 eV [45 ].
Nanoscale Characterization of Polymer Composites
The Atomic Force Microscopy (AFM) images were obtained using a Bruker Dimension Icon microscope. A thin slice of the sample was mounted onto a metallic disc glued with double-sided tape, and, for the electrical measurements, a thin layer of silver paint was used to connect the sample surface to the metallic disc and the microscope stage. Given the fact that Young’s moduli of PEDOT:PSS and PLGA are of the order of a few GPa [43 (link),44 (link)], for the nanomechanical measurements performed using the Quantitative Nanomechanics kit from Bruker, a Bruker RTESPA probe (nominal spring constant, k = 40 N/m, tip radius 8 nm) was selected since it is the one recommended for Young’s modulus ranging from 0.2 to 8.1 GPa. On the other hand, to obtain the surface potential maps by means of Kelvin Probe Force Microscopy (KPFM), a Bruker PFQNE-AL probe was used (k = 0.8 N/m, tip radius 5 nm). In this case, the work function of the tip was measured by using a gold/aluminum calibration sample (Bruker PFKPFM-SMPL) since the work function of gold can be averaged to 5.38 eV [45 ].
Corresponding Organization : Universidad de Cádiz
Variable analysis
- Sections of the samples
- Chemical composition of the samples
- Surface topography of the samples
- Surface potential of the samples
- Young's modulus of the samples
- No gold coating was applied to avoid interference between sulfur and gold
- Thin layer of silver paint was used to connect the sample surface to the metallic disc and the microscope stage
- Bruker RTESPA probe (nominal spring constant, k = 40 N/m, tip radius 8 nm) was used for nanomechanical measurements
- Bruker PFQNE-AL probe (k = 0.8 N/m, tip radius 5 nm) was used for Kelvin Probe Force Microscopy (KPFM)
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