The analysis of the oEV integrity and morphology was performed using transmission electron microscopy (TEM), as previously described [19 (link)]. Briefly, oEVs were left to adhere for 20 min on 200 mesh nickel formvar carbon-coated grids (Electron Microscopy Science, Hatfield, PA, USA). Subsequently, grids were incubated with 2.5% glutaraldehyde plus 2% sucrose and washed with distilled water. Finally, samples were negatively stained with Nano-Van and Nano-W (Nanoprobes, Yaphank, NY, USA) and acquired with Jeol JEM 1400 Flash electron microscope (Jeol, Tokyo, Japan). The analysis was repeated in three independent experiments.
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