Highly sensitive EQE was measured using a integrated system (PECT-600, Enlitech), where the photocurrent was amplified and modulated by a lock-in instrument. EQEEL measurements were performed by applying external voltage/current sources through the devices (ELCT-3010, Enlitech). All of the devices were prepared for EQEEL measurements according to the optimal device fabrication conditions. EQEEL measurements were carried out from 0 to 2 V).
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