Comprehensive Characterization of Hafnium and Zirconium Microporous Oxides
Corresponding Organization :
Other organizations : Shanghai Jiao Tong University, Indian Institute of Technology Hyderabad, International Advanced Research Centre for Powder Metallurgy and New Materials
Variable analysis
- Multi-functional high-intensity 2-Dimensional (2D) X-ray Diffraction system (RIGAKU RINT RAPID II with MicroMax 007HF Cu/Cr Dual-target Rotating-anode)
- Material Analysis Using Diffraction (MAUD®) software for Rietveld refinement
- CrystalMaker® software for generating atomic models
- Scanning electron microscope (SEM, VERSA 3D, FEI) for morphology study
- Simultaneous Thermal Analyzer (STA) STA 449 F3 (NETSCZH GmbH) for DSC/TGA test
- Renishaw inVia Qontor Raman spectrometer with 532 nm laser wavelength
- JEOL ARM 200F transmission electron microscopes (TEM) for microstructure characterization
- FLS1000 Edinburgh Analytical Instrument for photoluminescence measurement
- 500 Watt Xenon lamp for photocatalytic performance evaluation
- Lattice constants from Rietveld refinement
- Morphology of MPOs from SEM
- Thermal behavior from DSC/TGA
- Raman spectra
- Microstructures from TEM
- Photoluminescence spectra
- Photocatalytic performance
- Air atmosphere for DSC/TGA test
- Ramp rate of 10 K/min for DSC/TGA test
- Sample preparation method for TEM characterization
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