A UV-vis spectrophotometer (Perkin Elmer, LS 55) was used to characterize the synthesized AME-AgNPs. The components in the extract were characterized using a Shimadzu FTIR Prestige 21 spectrophotometer (Shimadzu Corporation, Kyoto, Japan) in the KBr phase (1:100).1 (link),2 (link),5 (link) The spectrum was recorded in the range of 400–4000 cm-1. The XRD pattern of the synthesized AME-Ag NPs was constructed using spectral data collected with a Philips PW-1830 X-ray diffractometer. A scanning electron microscope (SEM) (JEOL, Japan) and energy dispersive X-ray spectroscopy system (EDAX Inc.) were used. The AgNPs were observed by transmission electron microscopy (TEM) (JEOL, Japan).