The investigation of the surface topography of the prepared nanoparticles was achieved using a 2D and 3D Atomic Force Microscope at Faculty of Nanotechnology for Postgraduate Studies, Sheikh Zayed, Cairo University, Giza, Egypt. The technical information of AFM equipment are: AFM 5600LS, Agilent, Santa Clara, CA, USA. The sample preparation for AFM investigation was performed according to Elfaky et al.50 (link).
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