MTX-ZnONPs were characterized by UV-vis spectrophotometry (Shimadzu dual-beam spectrophotometer, model UV-1601 PC, 1 nm resolution. Kyoto, Japan). The mean particle size and zeta potential of MTX-ZnONPs were determined using a particle size analyzer (Zetasizer Nano-ZS, Model ZEN3600, Malvern Instruments Ltd., Malvern, United Kingdom) [(Gomathy and Sabarinathan, 2010 ), 15]. Transmission electron microscope (Tecnai™ G2 Spirit Bio-TWIN, FEI, Hillsboro, United States) was used to investigate the size of the inorganic core at a accelerating voltage of 80 kV (Khan S. et al., 2018 (link)). The binding confirmation of MTX on the surface of ZnONPs was analyzed by Fourier-transform infrared spectroscopy (FTIR) (Shimadzu FTIR-8201 PC infrared spectrophotometer) operating in the diffuse reflectance mode at a resolution of 4 cm−1. A total of 256 scans of the ZnONPs film (400–4,000 cm−1 range) were acquired to obtain good signal-to-noise ratios.
Free full text: Click here