Comprehensive Characterization of Ilmenite and TiO2 Nanoparticles

Characterization of raw ilmenite and titanium dioxide nano particles (TiO₂ NPs) were carried out by using different analytical techniques such as transmission electron microscopy (TEM) using a Zeiss EM-90 operating at 80 kV tension. Scanning Electron Microscope (SEM) Model Jeol 6510 JSM, LA. Brunauer–Emmett–Teller (BET) by using N2 adsorption/desorption at 77 K using an automatic surface area device (BELSORP MINI X). X-ray diffraction (XRD) (Paralytical Philips APD-3720, Netherlands) with Cu–kα radiation (λ = 0.154 cm⁻¹) and operated at 40 kV, 35 mA, 5 min scanning speed in the 2θ range of 5°–80°. Fourier transform infrared (FTIR) spectrum of TiO₂ NPs was recorded in the range of 400–4000 cm⁻¹ with a Bruker FT/IR-2000 spectrometer. X-ray fluorescence (XRF) technique using Axios MAX, PAN analytical, 40 kV, 50 Ma.

Free full text: Click here

Kholief M.G., Hesham A.E., Hashem F.S, & Mohamed F.M. (2024). Synthesis and utilization of titanium dioxide nano particle (TiO2NPs) for photocatalytic degradation of organics. Scientific Reports, 14, 11327.

Publication 2024

EM-90 MINI X FT/IR-2000 spectrometer

Corresponding Organization :

Other organizations : Beni-Suef University, Ain Shams University

Top 5 similar protocols

Variable analysis

independent variables

Characterization of raw ilmenite
Characterization of titanium dioxide nano particles (TiO2 NPs)

dependent variables

Transmission electron microscopy (TEM) using a Zeiss EM-90 operating at 80 kV tension
Scanning Electron Microscope (SEM) Model Jeol 6510 JSM, LA
Brunauer–Emmett–Teller (BET) by using N2 adsorption/desorption at 77 K using an automatic surface area device (BELSORP MINI X)
X-ray diffraction (XRD) (Paralytical Philips APD-3720, Netherlands) with Cu–kα radiation (λ = 0.154 cm−1) and operated at 40 kV, 35 mA, 5 min scanning speed in the 2θ range of 5°–80°
Fourier transform infrared (FTIR) spectrum of TiO2 NPs was recorded in the range of 400–4000 cm−1 with a Bruker FT/IR-2000 spectrometer
X-ray fluorescence (XRF) technique using Axios MAX, PAN analytical, 40 kV, 50 Ma

control variables

Control variables not explicitly mentioned

Annotations

Based on most similar protocols

Etiam vel ipsum. Morbi facilisis vestibulum nisl. Praesent cursus laoreet felis. Integer adipiscing pretium orci. Nulla facilisi. Quisque posuere bibendum purus. Nulla quam mauris, cursus eget, convallis ac, molestie non, enim. Aliquam congue. Quisque sagittis nonummy sapien. Proin molestie sem vitae urna. Maecenas lorem.

As authors may omit details in methods from publication, our AI will look for missing critical information across the 5 most similar protocols.

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Revolutionizing how scientists
search and build protocols!