The field emission scanning electron microscope (FESEM, Carl Zeiss, Germany) operated at a voltage of 5 kV with energy dispersive X-ray (EDX, Aztec Analysis Software, England) was used to determine the elemental components.
Characterization of HAART-AgNPs Conjugates
The field emission scanning electron microscope (FESEM, Carl Zeiss, Germany) operated at a voltage of 5 kV with energy dispersive X-ray (EDX, Aztec Analysis Software, England) was used to determine the elemental components.
Corresponding Organization :
Other organizations : University of KwaZulu-Natal, Universidade Federal de Minas Gerais, University of Namibia
Variable analysis
- None explicitly mentioned
- Absorption of the conjugated HAART-AgNPs (measured by UV-Vis spectroscopy)
- Size and morphology of the nanoparticles (examined by HR-TEM)
- Elemental components (determined by FESEM with EDX)
- Voltage of HR-TEM (200 kV)
- Voltage of FESEM (5 kV)
- No positive or negative controls were explicitly mentioned in the provided information.
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