Crystal sizes were determined using atomic force microscopy (AFM: Park NX10, Seoul, Korea), applying the no contact method and using an aluminum-coated silicone tip PPP-FMR (Nanosensors, PointProbe, Neuchatel, Switzerland) with a resonance frequency of 286–362 kHz and a spring constant of 20–80 N m−1. Samples of 0.5 × 0.5 cm were analyzed, and three 5 × 5 μm areas were scanned at a speed of 1 Hz with a resolution of 256 × 256 pixels [47 (link)]. A particle size of 20 particles was determined for each area of 5 μm × 5 μm, and the measurements were made on 5 different films and at 3 different areas of each one.
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