CZTS powder was synthesized using a mechanochemical method with elemental precursors of Cu, Zn, Sn, and S. First, the CZTS powder was mixed with anhydrous ethanol and ball-milled for 72 h to create a paste with a 20% solid coating. Then, the paste was coated on a substrate using the doctor-blade method and dried. For the densification process, a roll-press machine (WCRP-1015G, Wellcos Corp., Rep. Korea) was used to pass the dried CZTS coating through a pre-gap (resolution: 1 μm) at a speed of 0.2 m/s without heating. The roll compression of the CZTS coating was performed by setting the point where the substrate was not broken to 0 and changing it to the desired thickness (Figure 1).
Next, heating was performed at a rate of 2 °C/min to 570 °C and maintained at 570 °C for 30 min in a 2% H2/N2 gas environment. Se vapor was supplied during the heating by placing a mixture of Se and Al2O3 powder in the same chamber for the selenization of CZTS [9 (link)]. A solar cell had a device structure of soda lime glass (SLG)/Mo/CZTSe/CdS/i-ZnO/ZnO:Al/Ni/Al in a sequence. A Mo back electrode layer (~500 nm) was sputtered, and a CdS layer (50 nm) was deposited on the CZTSe film using a chemical bath method. i-ZnO and ZnO:Al layers (50 and 600 nm, respectively) were sputtered, and Ni/Al grid (50 and 500 nm) was thermally evaporated.
Scanning electron microscopy (SEM) images were obtained using Inspect F (FEI, USA) scanning electron microscope with an acceleration voltage of 15 kV, and X-ray diffraction patterns were obtained using D8 Advanced (Brucker Corporation, USA) diffractometer. The depth profiles of unpressed and pressed ZnO/CdS/CZTSe/Mo were analyzed using dynamic secondary ion mass spectrometry (SIMS, IMS 4FE7, Cameca) with a Cs+ ion gun (impact energy of 5.5 keV). Optical bandgaps were measured using UV/Vis transmission spectroscope (Cary 5000). After calibration, the current−voltage (j−V) curves were obtained using a class-AAA solar simulator (Yamashita Denso, YSS-50S). After calibration, external quantum efficiencies (EQEs) were measured using an incident photon-to-current conversion efficiency measurement system (PV Measurements, Inc., Boulder, CO, USA).
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