XPS data were collected using a Kratos AXIS Ultra spectrometer (Kratos Analytical, Manchester, UK). The instrument was equipped with a hybrid magnetic and electrostatic electron lens system, a delay-line detector, and a monochromatic Al Kα2 x-ray source (1486.7 eV). Data were collected at pressures of <9 × 10−9 torr with photoelectrons collected at 90° with respect to the sample surface normal unless otherwise specified. The electron collection lens aperture was set to sample a 700 μm–by–300 μm spot, and the analyzer pass energy was 80 eV for survey spectra and 10 eV for high-resolution spectra. The instrument energy scale and work function were calibrated using clean Au, Ag, and Cu standards. The instrument was operated by Vision Manager software v. 2.2.10 revision 5. The XPS data were analyzed using CasaXPS software (CASA Software Ltd.).
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