Comprehensive Characterization of Optoelectronic Materials

FTIR spectra were taken on an IFS-66V/S FTIR spectrophotometer. TEM and HRTEM images were obtained measured on a JEM-2100F transmission electron microscope. XPS measurements were performed on an ESCALAB250 spectrometer. UV-vis absorption spectra were measured on a UV-2600 (Shimadzu) spectrophotometer, and PL spectra on a FLS920P fluorescence spectrometer. Absolute PL QYs were measured on an Edinburgh FLS820-s spectrometer with a calibrated integrated sphere. 1H NMR spectra were obtained at room temperature on a Zhongke Niujin AS400 (400 MHz, 1H) instrument. TRPL measurements were conducted on a time-dependent single photon counting system based on the FLS920P Edinburgh spectrometer with an excitation wavelength of 365 nm. TA spectra were measured using a femtosecond transient absorption pump-probe spectrometer (Ultrafast Systems LLC) with a pump wavelength of 365 nm. XRD patterns were obtained on a Bruker D8 Advance X diffractometer with Cu K_α Source (λ = 1.5406 Å). SEM images were collected on a Hitachi SU8000 SEM (Hitachi Limited, Tokyo, Japan) under 5 kV acceleration voltage. UPS measurements were performed on a PREVAC system. LED performance was evaluated using the commercially available system (SHENZHEN PYNECT SCIENCE AND TECHNOLOGY Co, Ltd.), with current density-voltage characteristics been recorded on a Keithley 2400 source meter, and light-output measurements on a fiber integration sphere coupled with a QE Pro spectrometer.