XRD was carried out on solvent cast 5FU-loaded and blank PU films, and pure 5FU powder, using a Panalytical Empyrean X-ray diffractometer (Malvern Panalytical Ltd, Malvern, Worcestershire, UK) operating at 40 mA and 40 kV with Cu Kα radiation (λ = 1.541874 Å). The analysis was conducted at a 6° take-off angle and the samples were scanned over the 2θ range of 5° to 40° with a step size and step time of 0.026° and 179.52 s, respectively. The corresponding interlayer distances or d-spacing values were calculated from the XRD experimental parameters using Bragg’s equation [41 (link),42 (link),43 (link)].
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