Characterization of Nanomaterial Properties

UV-visible absorbance spectra were obtained using a PerkinElmer Lambda 950 spectrophotometer equipped with deuterium and halogen lamps. Photoluminescence measurements were performed using a Fluoromax 4 from Horiba Scientific, and photoluminescence quantum yields were determined using a quanta-phi integrating sphere accessory according to a previously described procedure.69 (link) Powder X-ray diffraction (XRD) was measured on a PANalytical X'Pert Powder X-ray diffractometer. Transmission electron microscopy (TEM) was performed on a FEI T12 BioTWIN and a FEI Talos F200X. Fourier transform infrared (FT-IR) spectra were obtained using a PerkinElmer Spectrum One FT-IR Spectrometer operating with an attenuated total reflectance (ATR) accessory.

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Hamachi L.S., Yang H., Jen-La Plante I., Saenz N., Qian K., Campos M.P., Cleveland G.T., Rreza I., Oza A., Walravens W., Chan E.M., Hens Z., Crowther A.C, & Owen J.S. (2019). Precursor reaction kinetics control compositional grading and size of CdSe1–xSx nanocrystal heterostructures †Electronic supplementary information (ESI) available. See DOI: 10.1039/c9sc00989b. Chemical Science, 10(26), 6539-6552.

Publication 2019

Lambda 950 spectrophotometer Fluoromax 4 X'Pert Powder X-ray diffractometer Talos F200X Spectrum One FT-IR Spectrometer

Deuterium Halogen Powder Transmission electron microscopy X ray X ray diffraction

Corresponding Organization : Barnard College

Other organizations : Lawrence Berkeley National Laboratory, Ghent University, Ghent University Hospital

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Variable analysis

independent variables

None explicitly mentioned

dependent variables

UV-visible absorbance spectra
Photoluminescence measurements
Photoluminescence quantum yields
Powder X-ray diffraction (XRD)
Transmission electron microscopy (TEM)
Fourier transform infrared (FT-IR) spectra

control variables

PerkinElmer Lambda 950 spectrophotometer equipped with deuterium and halogen lamps
Fluoromax 4 from Horiba Scientific for photoluminescence measurements
Quanta-phi integrating sphere accessory for photoluminescence quantum yield determination
PANalytical X'Pert Powder X-ray diffractometer for XRD measurements
FEI T12 BioTWIN and FEI Talos F200X for TEM
PerkinElmer Spectrum One FT-IR Spectrometer with attenuated total reflectance (ATR) accessory for FT-IR spectra

positive controls

None explicitly mentioned

negative controls

None explicitly mentioned

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