Near-Infrared Spectroscopic Analysis

The NIR spectra of the samples were collected in diffuse reflectance mode using a Fourier-transform near-infrared spectrometer (FTLA 2000, ABB, Dorval, QC, Canada). The spectrometer was equipped with an indium–gallium–arsenide (InGaAs) detector and operated under the control of Bomen–Grams software (version 7, ABB, Dorval, QC, Canada). Each spectrum was derived as the mean of 64 scans, covering the range from 10,000 to 4000 cm⁻¹ and obtained with a resolution of 8 cm⁻¹. Every sample underwent triplicate analysis, and only the resulting average was utilised for subsequent model analysis. The background was created using a Teflon reference material.