Electrical Measurements of Nanomaterials

The electrical measurement was carried out at room temperature using a commercial AFM microscope (Dimension 3000, Bruker, Camarillo, CA, USA). The electrical signals to the AFM were customized, using a break box, for device initialization and subsequent data acquisition. Non-invasive measurements were achieved with a contact force of 1.2 nN. The tip quality was also checked before and after measurements, to ensure that the tip apex suffered no degradation during prolonged measurements. The details of the measurements are described elsewhere [18 (link)].

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Carstens N., Vahl A., Gronenberg O., Strunskus T., Kienle L., Faupel F, & Hassanien A. (2021). Enhancing Reliability of Studies on Single Filament Memristive Switching via an Unconventional cAFM Approach. Nanomaterials, 11(2), 265.

Publication 2021

Dimension 3000

Device Electrical Microscope

Corresponding Organization : Jožef Stefan Institute

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Variable analysis

independent variables

Electrical signals to the AFM were customized, using a break box, for device initialization and subsequent data acquisition.

dependent variables

Electrical measurement

control variables

Room temperature
Contact force of 1.2 nN
Tip quality was checked before and after measurements to ensure no degradation

controls

No explicit mention of positive or negative controls

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