We performed in air AFM measurements of the sample deposited on glass, where TIRF measurements had been acquired. High-resolution images (1,024 × 1,024 pixels) and phase-controlled maps (26 (link)) were collected using an NX10 Atomic Force Microscope (Park Systems) under ambient conditions and in amplitude modulation noncontact (NC-AM) mode. We imaged square areas of 2 × 2 µm and 4 × 4 µm. We performed all of the measurements using sharp cantilevers (PPP-NCHR; Park Systems) with resonance frequency of 330 kHz and a typical apical radius of 8 nm. The raw images were flattened using the built-in software (XEI; Park Systems). To maintain consistency in the subsequent statistical analysis, all images were processed using the same parameters. The images were first flattened by a plane and then line-by-line in first regression order. This second step was repeated until a flat baseline in the line profile of the image was reached. During the process of flattening of the images, the aggregates were masked from the calculation to avoid modification and underestimation of their heights.