A Digital Instrument Multimode SPM in the tapping mode with BRUKER RTESPA-300 tip was used for observing the surface topographies and the corresponding thickness of different exfoliated nanosheets,17 (link) deposited on a clean silicon substrate (1 × 1 cm2) by drop casting method. The images were taken at a resolution of 256 × 256 pixel, by scanning an area of 10 × 10 μm2 at a rate of 1.00 Hz. Besides that, the values of operation point, integral gain, and P gain were fixed at 0.153 V, 1500 and 0.001, respectively.
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Nanosheets Surface Topography Characterization
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Corresponding Organization : Nankai University
Other organizations : Wuhan Institute of Technology
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Variable analysis
independent variables
- Scanning area (10 × 10 μm^2)
- Surface topographies
- Thickness of different exfoliated nanosheets
- Tip (BRUKER RTESPA-300)
- Scanning mode (tapping mode)
- Substrate (clean silicon substrate, 1 × 1 cm^2)
- Deposition method (drop casting)
- Image resolution (256 × 256 pixel)
- Scanning rate (1.00 Hz)
- Operation point (0.153 V)
- Integral gain (1500)
- P gain (0.001)
- No positive or negative controls were explicitly mentioned.
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