X-ray powder diffraction (XRPD) patterns of the samples were recorded on a PANalytical empyrean machine equipped with Cu Kα radiation as the X-ray source [71 (link)]. Measurements were made between 5 and 40° 2θ angles. Fourier transform infra-red (FTIR) measurements were performed on a PerkinElmer Frontier device with ZnSe ATR unit in the wavenumber region from 4000–500 cm−1 in the transmittance mode at a scan rate of 64 scans per cycle [72 (link)]. Thermal stability of the samples was assessed using thermogravimetric analysis (TGA) employing 10 mg sample on a TGA 4000 device by PerkinElmer under N2 atmosphere [73 (link)]. Scanning electron microscopy (SEM) imaging was performed on a ZEISS SIGMA 500 VP FE SEM device under different magnifications [74 (link)].
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