Samples were characterized by means of ex-situ X-ray diffraction (XRD), utilizing a PANalytical X’ Pert PRO MRD diffractometer with Ge (220) hybrid monochromator, employing a Cu Kα1 radiation (λ = 1.540598 Å). XRD revealed that the crystalline GST films are quasi single crystalline13 26 with vacancies ordered into layers6 (link).
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