Structural Characterization of Mo2C Hybrids

Morphological structure characterizations of Mo₂C hybrids were performed on SEM (JEOL-JSM-7001F) and TEM (FEI Talos F200X, FEI Titan ChemisSTEM, FEI Titan Themis). HAADF-STEM images were carried out by a Cs-corrected FEI Titan G2 60-300 equipped with a Super-X EDS detector. The LADIA package was used to analysis the strain states of Mo₂C nanocrystals during the loading and unloading of tensile stress^{32 (link)}. The surface electronic structure was checked by XPS spectra (XPX, PHI-5702). The C and N K-edge NEXAFS spectra were measured at the photoemission end-station at beamline BL10B in the National Synchrotron Radiation Laboratory (NSRL) in Hefei, China. X-ray absorption spectra (XANES and EXAFS) of Mo K-edge were measured on VESPERS beamline at the Canadian Light Source, by scanning a double crystal Si (111) monochromator and collecting emitted X-ray fluorescence.

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Yang Y., Qian Y., Luo Z., Li H., Chen L., Cao X., Wei S., Zhou B., Zhang Z., Chen S., Yan W., Dong J., Song L., Zhang W., Feng R., Zhou J., Du K., Li X., Zhang X.M, & Fan X. (2022). Water induced ultrathin Mo2C nanosheets with high-density grain boundaries for enhanced hydrogen evolution. Nature Communications, 13, 7225.

Publication 2022

JSM-7001F Talos F200X G2 60-300

Eds x Fluorescence Hybrids Light Radiation Stem Strain X ray

Corresponding Organization : Xi'an Jiaotong University

Other organizations : Shanxi University, Beijing Institute of Technology, Chinese Academy of Sciences, Institute of High Energy Physics, National Synchrotron Radiation Laboratory, University of Science and Technology of China, Beijing University of Technology, Hangzhou Dianzi University, Institute of Coal Chemistry, Canadian Light Source (Canada), Taiyuan University of Technology

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Variable analysis

independent variables

Tensile stress loading and unloading

dependent variables

Strain states of Mo2C nanocrystals
Surface electronic structure
C and N K-edge NEXAFS spectra
Mo K-edge X-ray absorption spectra (XANES and EXAFS)

control variables

SEM (JEOL-JSM-7001F) and TEM (FEI Talos F200X, FEI Titan ChemisSTEM, FEI Titan Themis) for morphological structure characterizations
HAADF-STEM images carried out by a Cs-corrected FEI Titan G2 60-300 equipped with a Super-X EDS detector
LADIA package used for analysis of strain states of Mo2C nanocrystals
XPS spectra (XPX, PHI-5702) for surface electronic structure
C and N K-edge NEXAFS spectra measured at the photoemission end-station at beamline BL10B in the National Synchrotron Radiation Laboratory (NSRL) in Hefei, China
Mo K-edge X-ray absorption spectra (XANES and EXAFS) measured on VESPERS beamline at the Canadian Light Source, by scanning a double crystal Si (111) monochromator and collecting emitted X-ray fluorescence

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