Transmission Electron Microscopy of Leaf Samples
Corresponding Organization : Northwest A&F University
Variable analysis
- Gy14 leaf samples
yf leaf samples- 9930 WT leaf samples
CsSRP43 CRISPR transgenic leaf samples
- Characteristics of leaf samples observed using transmission electron microscope (TEM)
- Leaf samples were collected from the 14th true leaves for Gy14 and
yf samples, and from the second expanded leaf for 9930 WT andCsSRP43 CRISPR transgenic samples - Leaf samples were cut into small pieces of ~0.2 mm × 0.2 mm size
- Leaf samples were fixed in a 4.0% glutaraldehyde solution
- Leaf samples were prepared for TEM according to Xiong
et al . [67 (link)] - Samples were observed using a Tecnai G2 Spirit Bio (FEI, USA) transmission electron microscope
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