For the morphological analysis of CS-SeNPs, a drop of nanoparticle solution was loaded on the carbon-coated copper grid for air-drying, then the samples were observed using transmission electron microscopy (JEM-1200EX, JEOL; Japan) at an accelerating voltage of 80 kV. The surface morphology of Se nanoparticles and elemental composition were studied under Raman Imaging and Scanning Electron Microscopes (RISE-Magna, TESCAN, Czech). The concentration of Se nanoparticles was determined by inductively coupled plasma mass spectrometry (i CAP Q ICP-MS, Thermo Scientific, USA). The size distribution and zeta potential of Se nanoparticles were measured by dynamic light scattering (DLS) using the Zetasizer Nano analyzer (Zetasizer NanoZS, Malvern Panalytical, Malvern, UK) as previously described by Awet et al.27 (link)