Scanning electron microscope (SEM) images of materials were acquired on Zeiss Supra 55. Transmission electron microscope (TEM) images and selected area electron diffraction (SAED) pattern were acquired on FEI TECNAI G2 (link) at 200 keV. X-ray diffraction (XRD) patterns were recorded on a Bruker D8 Advance diffractometer at 40 mA and 40 kV using Cu Kα radiation. X-ray photoelectron spectroscopy (XPS) was performed on a Kratos Axis Supra using monochromatic Al Kalph source (150 W). Metal contents in catalysts were determined by ICP-AES on a Thermo ICAP6300 Radial.
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