A Bruker Contour GTK (Bruker Nano GmbH, Berlin, Germany) optical noncontact surface profiling system (Figure 6) was used to measure the surface roughness. This system utilizes noncontact scanning white-light interferometry for 3D surface configuration. The average roughness value (Ra) of each specimen was calculated. Three tracings were performed on each specimen at three different locations (2 mm from each other along a predetermined line across the specimen). The mean of these values was taken as the surface roughness value. The data were processed using the Vision 64 software (Bruker Nano GmbH, Berlin, Germany) accompanying the Bruker Contour GT-K system [30 (link)].
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