3D-SIM Microscopy Sample Imaging
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Corresponding Organization : University of California, Berkeley
Protocol cited in 1 other protocol
Variable analysis
- Excitation wavelengths: 642 nm, 561 nm, 488 nm
- Fluorescence intensity
- Full width at half maximum (FWHM) of fluorescence peaks
- Microscope: Elyra PS.1 SIM (Zeiss)
- Objective lens: alpha Plan-Apochromat 100x/1.46 oil
- Fluorescence filters: 655 nm longpass, 570-620 nm bandpass, 495-550 nm bandpass
- Image acquisition: ZEN software (Zeiss)
- Image reconstruction: 3D-SIM with 3 rotated angled, 5 phase-shifted fluorescence image acquisitions, z-interval 101 nm
- Image analysis: SIMcheck plugin for ImageJ, multipeak fit analysis in Igor Pro
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