S-4800, Hitachi, Tokyo, Japan). For SEM, the samples were imaged at 3.0 kV after
sputter-coated with gold.21 (link)The microstructures of silk in aqueous solutions were evaluated with AFM
(Nanoscope V, Veeco, NY, USA). 2 μL of the diluted samples (0.01
wt%) were dropped onto freshly cleaved mica surface and measured by AFM
with a spring constant of 3 N m−1 in tapping mode.