Spectroscopic Imaging of Transition Metals
Corresponding Organization : Helwan University
Other organizations : Max Planck Institute for Solid State Research, Max Planck Institute for Intelligent Systems, University of Antwerp, Erich Schmid Institute of Materials Science, Austrian Academy of Sciences
Variable analysis
- Convergence semi-angle of 30 mrad
- Electron beam accelerating voltage of 100 kV
- Use of a fifth-order aberration corrector
- Dispersion of 1.2 eV per channel
- Exposure time of 50 ms per spectra
- Oxygen K-edge
- Mn and Ni L2,3 edges
- La M4,5 edge
- Use of a Nion UltraSTEM 100 microscope
- Use of a Gatan PEELS 666 spectrometer retrofitted with an Andor iXon 897 EMCCD camera
- Spatial grid of 32 by 128 pixels
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