Transmission Electron Microscopy (TEM, Jeol-Jem-1011 microscope), working at an accelerating voltage of 100 kV and equipped with a Quemesa Olympus CCD 11 Mp Camera, was utilized for the morphological characterization of as-synthesized SPIONs and SPION@PDA NPs. Organic-capped SPIONs, dispersed in chloroform, were deposited on 300-mesh carbon-coated Cu grid by dipping, while 5 µL of SPION@PDA NPs dispersed in ultrapure water was deposited by casting. Statistical analysis using freeware Image J analysis program was performed to evaluate average size of the “as synthesized” SPIONs. Staining of SPION@PDA NP samples was achieved by using an aqueous phosphotungstic acid solution 2% (w/v).
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