Using conditions similar to previously reported38 (link), 39 (link), 46 (link), 47 , visual imaging and analysis of particle size, morphology, and surface morphology was achieved by scanning electron microscopy (SEM). The powder samples were placed on double coated carbon conductive adhesive Pelco tabs™ (TedPella, Inc. Redding CA), which were adhered to aluminum stubs (Ted- Pella, Inc.) Subsequently, the powder sample in the stub was sputter coated with thin film of gold using Anatech Hummer 6.2 (Union city, CA, USA) system at 20µA for 90secs under Argon plasma. The electron beam with an accelerating voltage of 30 kV was used at a working distance of 10–10.4mm. SEM images were captured by SEM FEI Inspect S (Brno, Czeck republic) at several magnification levels.
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Characterizing Particle Size and Morphology by SEM
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Corresponding Organization : National Cancer Institute
Other organizations : The Ohio State University, Sutter Davis Hospital, Regenerative Medicine Institute
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Variable analysis
independent variables
- Sputter coating time (90 seconds)
- Sputter coating current (20 μA)
- Electron beam accelerating voltage (30 kV)
- Working distance (10–10.4 mm)
- Particle size
- Particle morphology
- Surface morphology
- Powder sample material (not explicitly mentioned)
- Carbon conductive adhesive Pelco tabs
- Aluminum stubs
- Argon plasma
- SEM equipment (FEI Inspect S)
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