PEF measurements were undertaken
using a bespoke Raman system that consisted of an inverted optical
microscope (IX71, Olympus), a monochromatic laser (green laser, ThorLabs)
with a beam splitter and long-pass filter (RazorEdge, Semrock), a
spectrograph (SP-2300i, Princeton Instruments), and a CCD camera (IXON,
Andor).12 (link),13 (link) To focus the laser (532 nm wavelength, 5
mW incident power), a 50× objective was used. PEF spectra were
collected with an exposure time of 1 s. A 30 μL sample of the
analyte molecule TMPyP, RhB, or QDs with and without PMMA at a concentration
of 10–9 M was deposited (drop-casting) above the
aligned FFNTs in the presence and absence of AgNPs. The average of
typically 10 measurements is reported. PEF measurements were performed
during an in situ applied electric field generated
through the application of 0–60 V, in steps of 5 V; the voltage
was applied using a PEW0028 DC power supply, following a process reported
previously.12 (link),35 (link) Electrical cables or bonding
wire was used to connect the microfabricated chip using silver paint,
and then a DC voltage was applied during in situ Raman
measurements as shown inFigure 1 a. Relaxation was also recorded after removing the
applied electric field or by applying low electric field values. The
current flow in the microfabricated chip was measured using a TENMA
digital multimeter (72-7725).
using a bespoke Raman system that consisted of an inverted optical
microscope (IX71, Olympus), a monochromatic laser (green laser, ThorLabs)
with a beam splitter and long-pass filter (RazorEdge, Semrock), a
spectrograph (SP-2300i, Princeton Instruments), and a CCD camera (IXON,
Andor).12 (link),13 (link) To focus the laser (532 nm wavelength, 5
mW incident power), a 50× objective was used. PEF spectra were
collected with an exposure time of 1 s. A 30 μL sample of the
analyte molecule TMPyP, RhB, or QDs with and without PMMA at a concentration
of 10–9 M was deposited (drop-casting) above the
aligned FFNTs in the presence and absence of AgNPs. The average of
typically 10 measurements is reported. PEF measurements were performed
during an in situ applied electric field generated
through the application of 0–60 V, in steps of 5 V; the voltage
was applied using a PEW0028 DC power supply, following a process reported
previously.12 (link),35 (link) Electrical cables or bonding
wire was used to connect the microfabricated chip using silver paint,
and then a DC voltage was applied during in situ Raman
measurements as shown in
applied electric field or by applying low electric field values. The
current flow in the microfabricated chip was measured using a TENMA
digital multimeter (72-7725).
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