The microstructure of composites was observed using a transmission electron microscope (TEM; TecnaiG2 (link) F20 S-Twin; FEI, Hillsboro, OR, USA) at 200 kV, and the samples were dispersed in ethanol and dropped onto a holey carbon film supported on a Cu grid. Nitrogen isotherm adsorption/desorption was measured at −196°C with a TriStar 3000 analyzer (Micromeritics, Atlanta, GA, USA). The mean size and crystal lattice properties of nanoparticles were analyzed by X-ray powder diffraction (XRD; X’pert PRO; PANalytical B.V., Almelo, the Netherlands) with a scanning range from 20° to 80°. Magnetic characterization was carried out with a vibrating sample magnetometer (VSM) on a model 6000 physical property measurement system (Quantum, San Jose, CA, USA) at 300 K. Photosensitizer content, pH responsiveness and amount of 1O2 of RB−MMSNs were characterized by ultraviolet–visible (UV/VIS) spectra (Lambda 25; PerkinElmer, Waltham, MA, USA). Additionally, process of fabrication was validated in the range of 400–4,000cm−1 by the Fourier transform infrared spectroscopy (FTIR) analysis (Nexus Model 470; GMI, Ramsey, MN, USA).
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Comprehensive Characterization of Composite Microstructure
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Other organizations : Hebei North University, Institute of Inorganic Chemistry of the Slovak Academy of Sciences, Shanghai Changzheng Hospital, Second Military Medical University
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Variable analysis
independent variables
- Composition of the composite materials
- Microstructure of the composites observed using TEM
- Nitrogen isotherm adsorption/desorption properties
- Mean size and crystal lattice properties of nanoparticles analyzed by XRD
- Magnetic characterization using VSM
- Photosensitizer content, pH responsiveness, and amount of 1O2 of RB-MMSNs characterized by UV/VIS spectra
- Validation of the fabrication process by FTIR analysis
- Transmission electron microscope (TEM; TecnaiG2 F20 S-Twin; FEI, Hillsboro, OR, USA) operated at 200 kV
- Samples dispersed in ethanol and dropped onto a holey carbon film supported on a Cu grid
- Nitrogen isotherm adsorption/desorption measured at −196°C with a TriStar 3000 analyzer (Micromeritics, Atlanta, GA, USA)
- X-ray powder diffraction (XRD; X'pert PRO; PANalytical B.V., Almelo, the Netherlands) with a scanning range from 20° to 80°
- Vibrating sample magnetometer (VSM) on a model 6000 physical property measurement system (Quantum, San Jose, CA, USA) at 300 K
- Ultraviolet–visible (UV/VIS) spectra (Lambda 25; PerkinElmer, Waltham, MA, USA)
- Fourier transform infrared spectroscopy (FTIR) analysis (Nexus Model 470; GMI, Ramsey, MN, USA)
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