To perform FI-ESR measurements, a transistor was attached and wire-bonded to a substrate holder with source, drain, and gate connections. The device-and-boat combination was lowered into a tube appropriate for ESR measurements and sealed under nitrogen using a rubber cap. The electrode wires were punctured through the cap in order to connect to the voltage source, and the puncture sites were sealed with epoxy to preserve vacuum.
All EPR measurements were taken on a Bruker E500 spectrometer using a Bruker ER 4122SHQE cavity and an X-band microwave source. An Oxford Instruments ESR900 cryostat controlled by an Oxford Instruments Mercury iTC was used for temperature-dependent spectra, and a Keithley 2602b source unit was used for electrical characterization. CustomXepr, a Python package developed by ref. 18 (link), was used to integrate data collected by these instruments and to automate measurements when desired.
All EPR measurements were taken on a Bruker E500 spectrometer using a Bruker ER 4122SHQE cavity and an X-band microwave source. An Oxford Instruments ESR900 cryostat controlled by an Oxford Instruments Mercury iTC was used for temperature-dependent spectra, and a Keithley 2602b source unit was used for electrical characterization. CustomXepr, a Python package developed by ref. 18 (link), was used to integrate data collected by these instruments and to automate measurements when desired.
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