Field emission scanning electron microscopy (FE-SEM Supra 35 VP-equipment, Carl Zeiss, Germany) and Energy-dispersive X-ray spectroscopy (EDX) were used to obtain micrography images of the samples. DiameterJ (plugin for the ImageJ software) assisted analysis was used to expedite measurement in FE-SEM images and reduce bias from manual data processing [46 (link)].
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